Introducing ZEISS Xradia Versa 630: The 3D X-Ray Microscope for semiconductor & failure analysis 1. Perform structural and failure analysis for process development, yield improvement and construction analysis of advanced semiconductor packages, including 2.5/3D and fan-out packages 2. Analyze printed circuit boards for reverse engineering and hardware security 3. Non-destructively image across length scales from module to package to interconnect for submicron-resolution characterization of defec
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If you are working in the semiconductor industry, you might be interested in learning this. Free report for engineers working in semiconductor & failure analysis labs! Learn how to increase semiconductor failure analysis success rates, throughput and turn around time. Download the free report by clicking the link here and learn how ZEISS Microscopy can help your labs improve today! https://zeiss.ly/electronics-semicon-xrmbundles-apac | ZEISS Microscopy
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