CHARLOTTE, N.C. — The IC design and test community's quest to achieve fewer than 100 defective parts per million (DPPM) is becoming more difficult as process technologies move below 100 nanometers.

Please provide your email address to receive an email when new articles are posted on . Researchers found that VRVF results were in reasonable agreement with baseline SAP. VRVF exams had higher ...

A methodology to create efficient manufacturing mixed-signal tests that reduce both test costs and test escapes.

Several vendors are ramping up new inspection equipment based on infrared, optical, and X-ray technologies in an effort to reduce defects in current and future IC packages. While all of these ...