Dual-frequency resonance tracking (DFRT) is a technique that utilizes contact mode atomic force microscopy (AFM) to measure a sample’s weak electrical or mechanical responses. Conventional resonance ...

A major advantage of atomic force microscopes (AFMs) is their versatility in integrating various operational modes that assess different material properties and functionalities. Among the most ...

The introduction of integrated functionality into MEMS devices, such as the incorporation of thin piezoelectric layers, led ...

Harmonic distortion is not a problem unless it becomes a problem. Harmonics are a breakdown of a distorted waveform into its separate frequencies, which are integer multiples of the fundamental ...