For quality control purposes, wafers, such as semiconductor or flat-panel display (FPD) chips, need to be examined under a microscope to verify that they meet specifications related to both circuit ...
San Jose-based KLA-Tencor Corp. has introduced the AIT XP, a wafer inspection tool that it said can dynamically adjust to changes in wafer pattern density during inspection, allowing it to inspect and ...
Dublin, March 08, 2021 (GLOBE NEWSWIRE) -- The "E-Beam Wafer Inspection Systems - Global Market Trajectory & Analytics" report has been added to ResearchAndMarkets.com's offering. The global market ...
Defect inspection scientists from Huazhong University of Science and Technology, Harbin Institute of Technology and The Chinese University of Hong Kong make a thorough review of new perspectives and ...
KLA Corporation KLAC is strengthening its position in the chip equipment market as AI-driven semiconductor complexity makes ...
Silicon (Si) has been the focus of the semiconductor industry and the modern electronic industry for the last half-century. However, its surface properties remain a mystery. The properties of the Si ...
Advanced machine learning is beginning to make inroads into yield enhancement methodology as fabs and equipment makers seek to identify defectivity patterns in wafer images with greater accuracy and ...
SAN JOSE, Calif. — Taking on Hitachi, KLA-Tencor and others, Applied Materials Inc. on Monday (June 6) entered the brightfield wafer inspection business, rolling out what it claims to provide the ...
AI plays a role in improving defect capture rate and distinguishing between yield-killing and nuisance defects. New developments in wafer edge inspection are proving essential to bonded wafer yields.
France-based company Unity-SC, which specializes in optical inspection tools for semiconductor wafer production, says that its new system will be able to increase yields in laser diode manufacturing.
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