Achieving both high sensitivity and a wide dynamic range remains a central challenge in microelectromechanical accelerometers.

We have studied for the first time the scaling of controlled nonlinear buckling processes in materials with dimensions in the molecular range (i.e., ~1 nm) through experimental and theoretical studies ...

In previous studies of thin film wrinkling on soft substrates, the mechanics models usually assume plane-strain deformation, which was found to disagree with experimental observations for narrow thin ...