This paper discusses an approach to timing closure to eliminate non-determinism in an asynchronous interface while performing AC characterization on ATE (automatic test equipment). By closing the ...

Many styles of test interfaces have been optimized for various constraints and goals over the years. There does, however appear to be a trend of test moving toward standard interfaces and increased ...

Although the term DigRF may lead to initial impressions of a digital signal somehow integrated into an RF signal path, this is not the case. DigRF is a published standard that describes a digital ...

Wanting to test the response curves on some analog parts, [Don Sauer] devised a way of using simple tools to graph analog tests on a computer. Here you can see the results of testing NPN, PNP, NMOS ...