Semiconductor Engineering

Dynamic Fault Injection For System-Level Simulation Of MEMS

In this paper a method for dynamic fault injection and fault simulation as well as its application to MEMS based sensor systems is described. The prerequisite for this approach is the availability of ...
EDN

Improving fault coverage for random-pattern-resistant designs

Designs with LogicBIST exhibit random pattern resistance because of the random nature of LBIST vectors, thus leading to low fault coverage. To handle this, we insert test points with the help of ...
Semiconductor Engineering

Fault Simulation Reborn

Fault simulation, one of the oldest tools in the EDA industry toolbox, is receiving a serious facelift after it almost faded from existence. In the early days, fault simulation was used to grade the ...
Design-Reuse

Preservation of Circuit Structure and Timing during Fault Emulation in FPGA

This paper presents a technique that allows to preserve structure of a circuit according to a target technology during fault emulation in FPGA. The technique is not restricted to any target technology ...