Click on the Tune Tab in the Master Panel. Set the tune high and low frequency according to the cantilevers being used and the application. For general tapping mode cantilevers: ...

An AFM instrument uses a probe with an atomically sharp tip to scan over the surface of a material. There are two main scanning modes with an AFM instrument: contact or dynamic (tapping) mode. Both ...

In this study, we employed microscopy, patented by Keysight Technologies, Inc., MAC Mode atomic force, which uses a magnetically-driven oscillating probe with an oscillation amplitude significantly ...

Photothermal AFM-IR, commonly referred to as AFM-IR, is an analytical technique used to understand the chemistry of a material at the nanoscale. It combines the nanoscale spatial resolution of atomic ...

Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

Knowing interaction forces between nanostructures and their substrates is important in nanomanufacturing, such as template-directed assembly. A new mechanical membrane-based AFM (atomic force ...